Development of a low-noise readout ASIC for Silicon Drift Detectors in high energy resolution X-ray spectrometry. (10th March 2017)

• Record Type: Journal Article
• Authors: Atkin, E.; Levin, V.; Malankin, E.; Shumikhin, V.
• Is Part Of: Journal of instrumentation. Volume 12:Number 3(2017:Mar.)
• Page Start: C03039
• Page End: C03039
• Publication Date: 2017-03-10
• Subjects: Analogue electronic circuits -- Electronic detector readout concepts (solid-state) -- Front-end electronics for detector readout; Scientific apparatus and instruments -- Periodicals; 502.84
• DOI: 10.1088/1748-0221/12/03/C03039
• Languages: English
• ISSNs: 1748-0221

Abstract

Abstract: ASIC with a low-noise readout channel for Silicon Drift Detectors in high energy resolution X-ray spectrometry was designed and prototyped in the AMS 350 nm CMOS process via Europractice as a miniASIC. For the analog readout channel tests there was used the detector module SDD-10-130-PTW LTplus-ic (PNDetector GmbH). The measured energy resolution of this module with the designed readout channel: 200 eV (FWHM) at 55 Fe, -16 °C, 1 kcps and a peaking time of 8 μ s.