Cite
HARVARD Citation
Gan, Z. et al. (2015). Measurement of mean inner potential and inelastic mean free path of ZnO nanowires and nanosheet. Materials research express. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Gan, Z. et al. (2015). Measurement of mean inner potential and inelastic mean free path of ZnO nanowires and nanosheet. Materials research express. p. . [Online].