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APA Citation
Nägelein, A., Liborius, L., Steidl, M., Blumberg, C., Kleinschmidt, P., Poloczek, A., & Hannappel, T. (2017). comparative analysis on resistance profiling along tapered semiconductor nanowires: multi-tip technique versus transmission line method. Journal of physics, 29, . http://access.bl.uk/ark:/81055/vdc_100087628420.0x000045