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HARVARD Citation
Nägelein, A. et al. (2017). Comparative analysis on resistance profiling along tapered semiconductor nanowires: multi-tip technique versus transmission line method. Journal of physics. p. . [Online].
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Nägelein, A. et al. (2017). Comparative analysis on resistance profiling along tapered semiconductor nanowires: multi-tip technique versus transmission line method. Journal of physics. p. . [Online].