Cite
HARVARD Citation
Mei, Y. et al. (n.d.). A comparative study of thermal characteristics of GaN-based VCSELs with three different typical structures. Semiconductor science and technology. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Mei, Y. et al. (n.d.). A comparative study of thermal characteristics of GaN-based VCSELs with three different typical structures. Semiconductor science and technology. p. . [Online].