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APA Citation
Bessette, S., Hovington, P., Demers, H., Golozar, M., Bouchard, P., Gauvin, R., & Zaghib, K. (2019). in-Situ Characterization of Lithium Native Passivation Layer in A High Vacuum Scanning Electron Microscope. Microscopy and microanalysis, 25, 866–873. http://access.bl.uk/ark:/81055/vdc_100087053677.0x00001e