Cite
APA Citation
Neelisetty, K. K., Mu, X., Gutsch, S., Vahl, A., Molinari, A., von Seggern, F., Hansen, M., Scherer, T., Zacharias, M., Kienle, L., Chakravadhanula, V. K., & Kübel, C. (2019). electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations. Microscopy and microanalysis, 25, 592–600. http://access.bl.uk/ark:/81055/vdc_100087052685.0x000027