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APA Citation
Portavoce, A., Hoummada, K., & Chow, L. (2019). coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and microanalysis, 25, 517–523. http://access.bl.uk/ark:/81055/vdc_100087052290.0x000021