Raman spectroscopic analysis on Li, N and (Li, N) implanted ZnO. (15th June 2018)
- Record Type:
- Journal Article
- Title:
- Raman spectroscopic analysis on Li, N and (Li, N) implanted ZnO. (15th June 2018)
- Main Title:
- Raman spectroscopic analysis on Li, N and (Li, N) implanted ZnO
- Authors:
- Mondal, Apu
Pal, S.
Sarkar, A.
Bhattacharya, T.S.
Das, Avishek
Gogurla, N.
Ray, S.K.
Kumar, Pravin
Kanjilal, D.
Devi, K.D.
Singha, A.
Chattopadhyay, S.
Jana, D. - Abstract:
- Abstract: Doping lithium (Li) and/or nitrogen (N) in ZnO and activation of shallow acceptors thereby have drawn specific scientific interest for the last few years. A comprehensive study employing Raman spectroscopy is being reported here on N and Li implantation effects in ZnO. Strong presence of 275 cm −1 Raman mode after N and (Li, N) implantation confirms its relation with doped nitrogen in ZnO. Weak presence of 510 cm −1 mode in the high fluence implanted ZnO indicates its origin with interstitial defects. No extra Raman mode has been identified in Li implanted samples. Raman mode with anomalously large intensity is found at 1562 cm −1 after (Li, N) co-implantation (highest fluence). Implantation causes huge increase of Raman modes ~ 540, 555 and 579 cm −1, with the last two bearing clear co-relations with interstitial Zn and O vacancy, respectively. To identify shallow acceptors due to dopant-defect complex, low temperature photoluminescence (PL) has been monitored but only donor related excitonic features are visible in the near band edge (NBE) emission. However, indications in favour of deep acceptors states are noted, particularly when Li is present in the sample. The deep acceptor level may be at~ 300 meV above the valence band consistent with previous results.
- Is Part Of:
- Materials science in semiconductor processing. Volume 80(2018)
- Journal:
- Materials science in semiconductor processing
- Issue:
- Volume 80(2018)
- Issue Display:
- Volume 80, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 80
- Issue:
- 2018
- Issue Sort Value:
- 2018-0080-2018-0000
- Page Start:
- 111
- Page End:
- 117
- Publication Date:
- 2018-06-15
- Subjects:
- ZnO -- Ion implantation -- Raman spectroscopy -- Photoluminescence -- Acceptors
Semiconductors -- Periodicals
Integrated circuits -- Materials -- Periodicals
Semiconducteurs -- Périodiques
Circuits intégrés -- Matériaux -- Périodiques
Electronic journals
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/latest/13698001 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.mssp.2018.02.026 ↗
- Languages:
- English
- ISSNs:
- 1369-8001
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5396.440600
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
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