Cite
APA Citation
Brandelero, J., Ewanchuk, J., Degrenne, N., & Mollov, S. (2018). lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module. Microelectronics and reliability, 88, 428–432. http://access.bl.uk/ark:/81055/vdc_100069045999.0x000056