Cite
HARVARD Citation
Brandelero, J. et al. (2018). Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module. Microelectronics and reliability. pp. 428-432. [Online].
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Brandelero, J. et al. (2018). Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module. Microelectronics and reliability. pp. 428-432. [Online].