Assessing body built-in current sensors for detection of multiple transient faults. (September 2018)

• Record Type: Journal Article
• Authors: Viera, R.A.C.; Dutertre, J.-M.; Flottes, M.-L.; Potin, O.; Natale, G. Di; Rouzeyre, B.; Bastos, R. Possamai
• Is Part Of: Microelectronics and reliability. Volume 88/90(2018)
• Page Start: 128
• Page End: 134
• Publication Date: 2018-09
• Subjects: Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2018.07.111
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit. Highlights: The ability of a bulk built-in current sensor detecting multiple transient faults. Detection of transient faults arisen from laser irradiation. A sensor for protecting systems running in harsh environments like in space.