Cite
HARVARD Citation
Zerarka, M. et al. (2018). Radiation robustness of normally-off GaN/HEMT power transistors (COTS). Microelectronics and reliability. pp. 984-991. [Online].
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Zerarka, M. et al. (2018). Radiation robustness of normally-off GaN/HEMT power transistors (COTS). Microelectronics and reliability. pp. 984-991. [Online].