Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs). (September 2018)

• Record Type: Journal Article
• Authors: Li, Nga Man; Manoharan, Subramani; Das, Diganta; McCluskey, Patrick
• Is Part Of: Microelectronics and reliability. Volume 88/90(2018)
• Page Start: 528
• Page End: 533
• Publication Date: 2018-09
• Subjects: MLCC -- Ceramic capacitor -- Mechanical properties -- Indentation; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2018.07.116
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Most failures of Multilayer Ceramic Capacitors (MLCCs) are mechanical (e.g., cracking) in nature. Therefore, reliability assessment of these parts depends heavily on the available mechanical properties in the literature. As indentation offers advantages such as minimal sample preparation and access to small areas, more mechanical properties on MLCCs based on measurement by indentation are being published in literature. However, indentation measured properties are known to vary with different factors such as measuring loads, geometry of indenter tip, and residual stresses. In this article, indentations are performed on commercial MLCCs at different loads and locations with different indenter tips. By identifying the causes of variations and understanding the limitations and implications of the indentation measured properties, the use of indentation for reliability assessment of MLCCs, and other electronic components can be facilitated. Highlights: In-depth literature review on application of nanoindentation to ceramic capacitors presented. Extensive nanoindentation of multilayered ceramic capacitors performed. Factors affecting material behavior presented along with results. Causes of variation discussed.