Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. (September 2018)
- Record Type:
- Journal Article
- Title:
- Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. (September 2018)
- Main Title:
- Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter
- Authors:
- Ceccarelli, L.
Luo, H.
Iannuzzo, F. - Abstract:
- Abstract: In this paper, the light emission of SiC MOSFETs during reverse conduction, caused by the Light Emission Diode (LED)-like behaviour of the body diode, is studied and investigated. The photoemission from a 1.2 kV/20 A commercial device has been measured experimentally using a silicon photodiode. A behavioural characterization of the light output under different junction temperatures and current values has been performed. This allows the implementation of a fast, inexpensive and non-invasive temperature sensing strategy for high-voltage SiC MOSFET chips based on the measurement of light emission during reverse conduction. Highlights: The photoemission from a 1.2 kV/20 A commercial SiC power MOSFET has been measured experimentally using a silicon photodiode; A behavioural characterization of the light emission under different junction temperatures and current values has been carried out on two SiC MOSFET samples; The photodiode output voltage could be correlated to the light emission intensity, changing current and case temperature, and was proven to be a promising temperature-sensitive electrical parameter; A first proof of concept of the implementation of a fast, inexpensive and non-invasive temperature sensing strategy for high-voltage SiC MOSFET chips based on light emission is provided.
- Is Part Of:
- Microelectronics and reliability. Volume 88/90(2018)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 88/90(2018)
- Issue Display:
- Volume 88/90, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 88/90
- Issue:
- 2018
- Issue Sort Value:
- 2018-NaN-2018-0000
- Page Start:
- 627
- Page End:
- 630
- Publication Date:
- 2018-09
- Subjects:
- Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2018.07.027 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 10945.xml