Manufacturing process-based storage degradation modelling and reliability assessment. (September 2018)
- Record Type:
- Journal Article
- Title:
- Manufacturing process-based storage degradation modelling and reliability assessment. (September 2018)
- Main Title:
- Manufacturing process-based storage degradation modelling and reliability assessment
- Authors:
- Ye, X.
Lin, Y.
Wang, Q.
Niu, H.
Zhai, G. - Abstract:
- Abstract: Quality variations in manufacturing are significant factors for product's reliability. In this paper, a manufacturing process-based storage degradation modelling and reliability assessment approach is proposed to describe the uncertainty of product's storage degradation path caused by manufacturing process. Firstly, a storage degradation model of the output characteristic is constructed, by combining the functional relationship between output characteristic and bottom level performance (BLP for short, such as dimension, mechanical properties, material properties, etc.) with the storage degradation mechanism of products. This model is able to reflect the unit-to-unit variability of batch products. Secondly, based on finite element simulation and approximate modelling method, the unit-to-unit variability caused by manufacturing process is analysed, and the distribution characteristics of the random effect parameters (REPs) of the model are calculated accordingly. Finally, the storage reliability of the batch products is estimated based on the model and the calculated distribution characteristics of REPs. A case study of the aerospace relay is carried out to illustrate the effectiveness of the proposed approach.
- Is Part Of:
- Microelectronics and reliability. Volume 88/90(2018)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 88/90(2018)
- Issue Display:
- Volume 88/90, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 88/90
- Issue:
- 2018
- Issue Sort Value:
- 2018-NaN-2018-0000
- Page Start:
- 107
- Page End:
- 110
- Publication Date:
- 2018-09
- Subjects:
- Manufacturing process -- Storage reliability -- Degradation modelling -- Unit-to-unit variability -- Reliability assessment
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2018.06.085 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 10945.xml