Wetting of amorphous and partial crystalline Co73Si10B17 by Sn and Sn-based lead-free solders. (July 2019)
- Record Type:
- Journal Article
- Title:
- Wetting of amorphous and partial crystalline Co73Si10B17 by Sn and Sn-based lead-free solders. (July 2019)
- Main Title:
- Wetting of amorphous and partial crystalline Co73Si10B17 by Sn and Sn-based lead-free solders
- Authors:
- Lin, Qiaoli
Ye, Changsheng
Sui, Ran
Ci, Wenjuan - Abstract:
- Abstract: Using wetting balance method, the wetting of Co73 Si10 B17 in amorphous and partial crystalline states by Sn and Sn-based lead-free solders (Sn-0.7Cu and Sn-0.3Ag-0.7Cu) were studied at 290–310 °C. The surface energy of the Co-based alloys was calculated by three methods (Zisman method, Fowkes and Owen theory). Although the calculated surface energy shows the presence of oxide film on the surface of all Co-based alloy, the amorphous Co73 Si10 B17 has a relatively higher surface energy. The wetting mechanism is the oxide film removal, which was caused by a series of complex multiple reactions. The final wettability of Co73 Si10 B17 was affected by the interfacial reaction products and surface oxide film, but was determined by the degree of the oxide film removal. In addition, RMA flux is not very effective for soldering of Co-based alloy whether in amorphous or partial crystalline state owing to its weak activity, especially it is not suitable for soldering of partial crystalline Co73 Si10 B17 . Highlights: Amorphous Co73 Si10 B17 has a better wettability than partial crystalline one. Wetting was caused by the oxide film removal. Relatively higher surface energy of amorphous Co73 Si10 B17 caused the better wettability.
- Is Part Of:
- Microelectronics and reliability. Volume 98(2019)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 98(2019)
- Issue Display:
- Volume 98, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 98
- Issue:
- 2019
- Issue Sort Value:
- 2019-0098-2019-0000
- Page Start:
- 112
- Page End:
- 118
- Publication Date:
- 2019-07
- Subjects:
- Wettability -- Oxide film -- Intermetallics -- Joining
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2019.05.006 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 10922.xml