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APA Citation
Arroyo, R. D., Isa, F., Isella, G., Erni, R., von Känel, H., Gröning, P., & Rossell, M. D. (2019). effect of thermal annealing on the interface quality of Ge/Si heterostructures. Scripta materialia, , 52–56. http://access.bl.uk/ark:/81055/vdc_100086497695.0x000011