Cite
APA Citation
Gelczuk, Ł., Kopaczek, J., Rockett, T. B. O., Richards, R., & Kudrawiec, R. (2017). deep-level defects in n-type GaAsBi alloys grown by molecular beam epitaxy at low temperature and their influence on optical properties. Scientific reports, 7(1), 1–11. http://access.bl.uk/ark:/81055/vdc_100084758608.0x000024