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HARVARD Citation
Amirante, E. et al. (2001). Three-dimensional Statistical Modeling of the Effects of the Random Distribution of Dopants in Deep Sub-micron nMOSFETs. VLSI design. 13 (1), pp. 425-429. [Online].
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Amirante, E. et al. (2001). Three-dimensional Statistical Modeling of the Effects of the Random Distribution of Dopants in Deep Sub-micron nMOSFETs. VLSI design. 13 (1), pp. 425-429. [Online].