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APA Citation
Petrashin, P., Toledo, L., Lancioni, W., Osuch, P., & Stander, T. (2017). oscillation-Based Test Applied to a Wideband CCII. VLSI design, 2017, . http://access.bl.uk/ark:/81055/vdc_100082239697.0x00004b
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Petrashin, P., Toledo, L., Lancioni, W., Osuch, P., & Stander, T. (2017). oscillation-Based Test Applied to a Wideband CCII. VLSI design, 2017, . http://access.bl.uk/ark:/81055/vdc_100082239697.0x00004b