Cite
APA Citation
Narayandas, K., Radhakrishnan, M., & Balasubramanian, C. (1982). defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance. Electrocomponent science and technology, 9, 171–178. http://access.bl.uk/ark:/81055/vdc_100082252555.0x000056