Cite
HARVARD Citation
Narayandas, K. et al. (1982). Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance. Electrocomponent science and technology. pp. 171-178. [Online].
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Narayandas, K. et al. (1982). Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance. Electrocomponent science and technology. pp. 171-178. [Online].