A Simulative Approach to Electron Conduction in Thick-Film Resistors. (1983)
- Record Type:
- Journal Article
- Title:
- A Simulative Approach to Electron Conduction in Thick-Film Resistors. (1983)
- Main Title:
- A Simulative Approach to Electron Conduction in Thick-Film Resistors
- Authors:
- Jacoboni, C.
Prudenziati, M.
Rizzi, A. - Abstract:
- Abstract : A simulative approach to the calculation of electrical transport in thick-film resistors is presented, in which electrons are considered to hop from and to metallic grains and localized states in the glass. For concentrations of metallic grains sufficiently low and of localized states sufficiently high, a maximum in conductivity as a function of temperature is obtained due to a balance between the tendency of temperature to favour hopping and to oppose an ordered response to an external force.
- Is Part Of:
- Electrocomponent science and technology. Volume 10:Number 2/3(1983)
- Journal:
- Electrocomponent science and technology
- Issue:
- Volume 10:Number 2/3(1983)
- Issue Display:
- Volume 10, Issue 2/3 (1983)
- Year:
- 1983
- Volume:
- 10
- Issue:
- 2/3
- Issue Sort Value:
- 1983-0010-NaN-0000
- Page Start:
- 103
- Page End:
- 110
- Publication Date:
- 1983
- Subjects:
- Electronics -- Periodicals
Electronic circuits -- Periodicals
621.3815 - Journal URLs:
- https://www.hindawi.com/journals/apec/contents/electrocomponent.science.and.technology/ ↗
- DOI:
- 10.1155/APEC.10.103 ↗
- Languages:
- English
- ISSNs:
- 0305-3091
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 10177.xml