Cite
HARVARD Citation
Chen, X. et al. (2019). Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques. Measurement. pp. 387-402. [Online].
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Chen, X. et al. (2019). Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques. Measurement. pp. 387-402. [Online].