Cite
HARVARD Citation
Hu, Z. et al. (2019). Anomalous formation of micrometer-thick amorphous oxide surficial layers during high-temperature oxidation of ZrAl2. Journal of materials science & technology. 35 (7), pp. 1479-1484. [Online].
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Hu, Z. et al. (2019). Anomalous formation of micrometer-thick amorphous oxide surficial layers during high-temperature oxidation of ZrAl2. Journal of materials science & technology. 35 (7), pp. 1479-1484. [Online].