Cite
MLA Citation
Shaobo Cheng et al.. “Ferroelectrics: Revealing the Effects of Trace Oxygen Vacancies on Improper Ferroelectric Manganite with In Situ Biasing (Adv. Electron. Mater. 4/2019).” Advanced Electronic Materials, vol. 5, 2019, p. n/a. http://access.bl.uk/ark:/81055/vdc_100080189339.0x000001