Cite
HARVARD Citation
Jang, H. et al. (2019). Analysis of anisotropic in-plane strain behavior in condensed Si1−xGex fin epitaxial layer using X-ray reciprocal space mapping. Japanese journal of applied physics. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Jang, H. et al. (2019). Analysis of anisotropic in-plane strain behavior in condensed Si1−xGex fin epitaxial layer using X-ray reciprocal space mapping. Japanese journal of applied physics. p. . [Online].