Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals. Issue 4 (14th December 2018)
- Record Type:
- Journal Article
- Title:
- Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals. Issue 4 (14th December 2018)
- Main Title:
- Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals
- Authors:
- Li, Teng
Krumeich, Frank
Ihli, Johannes
Ma, Zhiqiang
Ishikawa, Takashi
Pinar, Ana B.
van Bokhoven, Jeroen A. - Abstract:
- Abstract : A heavy-atom labeling approach in conjunction with electron microscopy allows visualization of the distribution of silanol defects at the single crystal level. Abstract : Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.
- Is Part Of:
- Chemical communications. Volume 55:Issue 4(2019)
- Journal:
- Chemical communications
- Issue:
- Volume 55:Issue 4(2019)
- Issue Display:
- Volume 55, Issue 4 (2019)
- Year:
- 2019
- Volume:
- 55
- Issue:
- 4
- Issue Sort Value:
- 2019-0055-0004-0000
- Page Start:
- 482
- Page End:
- 485
- Publication Date:
- 2018-12-14
- Subjects:
- Chemistry -- Periodicals
540 - Journal URLs:
- http://pubs.rsc.org/en/journals/journalissues/cc ↗
http://www.rsc.org/ ↗ - DOI:
- 10.1039/c8cc07912a ↗
- Languages:
- English
- ISSNs:
- 1359-7345
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3139.350000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 9472.xml