Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals. Issue 4 (14th December 2018) - Li, Teng
Abstract : A heavy-atom labeling approach in conjunction with electron microscopy allows visualization of the distribution of silanol defects at the single crystal level. Abstract : Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.