Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. (10th January 2019)

Record Type:: Journal Article
Title:: Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. (10th January 2019)
Main Title:: Cluster secondary ion emission of silicon: An influence of the samples' dimensional features
Authors:: Tolstogouzov, Alexander
Drozdov, Mikhail N.
Belykh, Sergey F.
Gololobov, Gennady P.
Ieshkin, Alexei E.
Mazarov, Paul
Suvorov, Dmitriy V.
Fu, Dejun
Pelenovich, Vasiliy
Zeng, Xiaomei
Zuo, Wenbin
Abstract:
Is Part Of:: Rapid communications in mass spectrometry. Volume 33:Number 3(2019)
Journal:: Rapid communications in mass spectrometry
Issue:: Volume 33:Number 3(2019)
Issue Display:: Volume 33, Issue 3 (2019)
Year:: 2019
Volume:: 33
Issue:: 3
Issue Sort Value:: 2019-0033-0003-0000
Page Start:: 323
Page End:: 325
Publication Date:: 2019-01-10
Subjects:: Mass spectrometry -- Periodicals
543.65
Journal URLs:: http://onlinelibrary.wiley.com/ ↗
DOI:: 10.1002/rcm.8345 ↗
Languages:: English
ISSNs:: 0951-4198
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 7254.440000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store
Ingest File:: 9458.xml