Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. (10th January 2019) - Tolstogouzov, Alexander; Drozdov, Mikhail N.; Belykh, Sergey F.; Gololobov, Gennady P.; Ieshkin, Alexei E.; Mazarov, Paul; Suvorov, Dmitriy V.; Fu, Dejun; Pelenovich, Vasiliy; Zeng, Xiaomei; Zuo, Wenbin