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APA Citation
Beyreuther, A., Vogt, I., Herfurth, N., Nakamura, T., Fischer, G., Motamedi, B., & Boit, C. (2019). contactless parametric characterization of bandgap engineering in p-type FinFETs using spectral photon emission. Microelectronics and reliability, 92, 143–148. http://access.bl.uk/ark:/81055/vdc_100076147675.0x000055