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HARVARD Citation
Beyreuther, A. et al. (2019). Contactless parametric characterization of bandgap engineering in p-type FinFETs using spectral photon emission. Microelectronics and reliability. pp. 143-148. [Online].
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Beyreuther, A. et al. (2019). Contactless parametric characterization of bandgap engineering in p-type FinFETs using spectral photon emission. Microelectronics and reliability. pp. 143-148. [Online].