Cite
HARVARD Citation
Tinoco, J. et al. (n.d.). Modelling and extraction procedure for gate insulator and fringing gate capacitance components of an MIS structure. Semiconductor science and technology. p. . [Online].
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Tinoco, J. et al. (n.d.). Modelling and extraction procedure for gate insulator and fringing gate capacitance components of an MIS structure. Semiconductor science and technology. p. . [Online].