Life time comparison of LED package and the self-ballasted LED lamps by simple linear regression analysis. Issue 9 (August 2015)
- Record Type:
- Journal Article
- Title:
- Life time comparison of LED package and the self-ballasted LED lamps by simple linear regression analysis. Issue 9 (August 2015)
- Main Title:
- Life time comparison of LED package and the self-ballasted LED lamps by simple linear regression analysis
- Authors:
- Yoon, Y.G.
Hyung, J.P.
Jeong, U.H.
Lim, H.W.
Jang, J.S. - Abstract:
- Abstract: The energy efficient long-life self-ballasted LED lamps are designed considering the reliability test result of LED package. We also try to predict the lumen maintenance life for the self-ballasted LED lamps because there were a lot of failure mechanisms for a various environment stress. Many studies have investigated the environmental stress effects on LED packages[2, 3, 4, and 5]. However, comparing to LED package, there is not enough data to study the lumen maintenance life for the self-ballasted LED lamps. IES LM-80-08 is the approved method for measuring lumen maintenance of LED light sources [1]. It suggests using the Arrhenius Equation to calculate the interpolated lumen maintenance life. We followed this method and obtained lumen degradation patterns from three different thermal stresses as indicated in the IEC 62621 standard. Under the three different thermal stresses, the on-off test (30 on and 30 s off) was conducted on the self-ballasted LED lamps which were made of the same selected LED package (3 V, 64 mA). The intent of the research isn't to set up a new curve-fit for non-linear lumen degradation pattern. Our research goals are to find methods to compare the lumen degradation pattern of LED package and the self-ballasted LED lamp using simple linear regression analysis. As simple straight linear line is assumed for lumen degradation after ALT testing We found the slope of the mathematical model is easily comparable for three different temperaturesAbstract: The energy efficient long-life self-ballasted LED lamps are designed considering the reliability test result of LED package. We also try to predict the lumen maintenance life for the self-ballasted LED lamps because there were a lot of failure mechanisms for a various environment stress. Many studies have investigated the environmental stress effects on LED packages[2, 3, 4, and 5]. However, comparing to LED package, there is not enough data to study the lumen maintenance life for the self-ballasted LED lamps. IES LM-80-08 is the approved method for measuring lumen maintenance of LED light sources [1]. It suggests using the Arrhenius Equation to calculate the interpolated lumen maintenance life. We followed this method and obtained lumen degradation patterns from three different thermal stresses as indicated in the IEC 62621 standard. Under the three different thermal stresses, the on-off test (30 on and 30 s off) was conducted on the self-ballasted LED lamps which were made of the same selected LED package (3 V, 64 mA). The intent of the research isn't to set up a new curve-fit for non-linear lumen degradation pattern. Our research goals are to find methods to compare the lumen degradation pattern of LED package and the self-ballasted LED lamp using simple linear regression analysis. As simple straight linear line is assumed for lumen degradation after ALT testing We found the slope of the mathematical model is easily comparable for three different temperatures and for different number of LED whether it is single or consists of forty or eighty LED. By comparing each values of the slope the effect of increase in number of LED can be shown at each thermal stress. This study is the first step towards the presentation on the lumen maintenance life of the self-ballasted LED lamp on three different temperatures. Additional information must be accumulated in the future to further study on the LED lighting product reliability. Highlights: We try to find out new approach for LED Lamp's life based on single LED life. We use slop compare with single LDE package and LED lamp life We show at each thermal stress for increasing number of LED … (more)
- Is Part Of:
- Microelectronics and reliability. Volume 55:Issue 9/10(2015)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 55:Issue 9/10(2015)
- Issue Display:
- Volume 55, Issue 9/10 (2015)
- Year:
- 2015
- Volume:
- 55
- Issue:
- 9/10
- Issue Sort Value:
- 2015-0055-NaN-0000
- Page Start:
- 1779
- Page End:
- 1783
- Publication Date:
- 2015-08
- Subjects:
- LED -- Lamp -- Lumen -- ALT
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2015.07.044 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 9154.xml