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HARVARD Citation
Fichtner, S. et al. (2015). Ruggedness of 1200 V SiC MPS diodes. Microelectronics and reliability. 55 (9), pp. 1677-1681. [Online].
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Fichtner, S. et al. (2015). Ruggedness of 1200 V SiC MPS diodes. Microelectronics and reliability. 55 (9), pp. 1677-1681. [Online].