Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Issue 9 (August 2015)

• Record Type: Journal Article
• Authors: Huang, H.; Boyer, A.; Ben Dhia, S.
• Is Part Of: Microelectronics and reliability. Volume 55:Issue 9/10(2015)
• Page Start: 2050
• Page End: 2054
• Publication Date: 2015-08
• Subjects: Counterfeit detection -- Electromagnetic emission -- Integrated circuit; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2015.07.008
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Counterfeit integrated circuits become a big challenge for the whole electronic industry. The use of electronic counterfeits can cause reduced performance of circuits, or failure of the whole system. New efficient approaches of counterfeit device detection are always required. Since the electromagnetic emission level of integrated devices depends on various circuit parameters like technology, manufacturing and aging, the electromagnetic emission measurement could be an approach to detect the counterfeit. In this article, the principles of the methodology are explained and two case studies are presented, where three ways of analysis of data are discussed. Highlights: Presenting a study about the feasibility to distinguish authentic and counterfeit devices through EME measurements Conducted EME measurements have been led to extract the electromagnetic fingerprint. The principles of the methodology are explained and two case studies are presented (aged component and small modification of design). Three ways of statistical analysis of data are discussed.