Cite
HARVARD Citation
Baccar, F. et al. (2015). Ageing mechanisms in Deep Trench Termination (DT2) Diode. Microelectronics and reliability. 55 (9), pp. 1981-1987. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Baccar, F. et al. (2015). Ageing mechanisms in Deep Trench Termination (DT2) Diode. Microelectronics and reliability. 55 (9), pp. 1981-1987. [Online].