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APA Citation
Woirgard, E., Arabi, F., Sabbah, W., Martineau, D., Theolier, L., & Azzopardi, S. (2015). identification and analysis of power substrates degradations subjected to severe aging tests. Microelectronics and reliability, 55(9), 1961–1965. http://access.bl.uk/ark:/81055/vdc_100051343960.0x00005e