Cite
HARVARD Citation
Woirgard, E. et al. (2015). Identification and analysis of power substrates degradations subjected to severe aging tests. Microelectronics and reliability. 55 (9), pp. 1961-1965. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Woirgard, E. et al. (2015). Identification and analysis of power substrates degradations subjected to severe aging tests. Microelectronics and reliability. 55 (9), pp. 1961-1965. [Online].