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APA Citation
Sharma, P., Tyaginov, S., Wimmer, Y., Rudolf, F., Rupp, K., Enichlmair, H., Park, J., Ceric, H., & Grasser, T. (2015). comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. Microelectronics and reliability, 55(9), 1427–1432. http://access.bl.uk/ark:/81055/vdc_100051211279.0x000063