Cite
HARVARD Citation
Sharma, P. et al. (2015). Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. Microelectronics and reliability. 55 (9), pp. 1427-1432. [Online].
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Sharma, P. et al. (2015). Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. Microelectronics and reliability. 55 (9), pp. 1427-1432. [Online].