Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter. Issue 9 (August 2015)
- Record Type:
- Journal Article
- Title:
- Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter. Issue 9 (August 2015)
- Main Title:
- Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter
- Authors:
- Huang, H.
Boyer, A.
Ben Dhia, S. - Abstract:
- Abstract: Past works showed that the degradation of the passive components caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. This paper presents the impact of the accelerated thermal aging on the electromagnetic emission (EME) of a buck DC–DC converter. The experimental analysis indicates that the aging degradation of several passive components (electrolytic capacitor and powder iron inductor) is the main source of EME evolution. Based on experimental measurement and physical analysis, the empirical degradation models of related passive devices are proposed. The overall objective of this study is to predict the electromagnetic emission evolution of a buck DC–DC converter under a thermal aging, by using these passive device degradation models. Highlights: Modeling of electromagnetic emission level of converters based on the degradation analysis of passive devices Study of the thermal accelerated aging impact on the electromagnetic emission of a buck DC–DC converter Evolution of conducted emission is explained by the degradation of filtering capacitors and inductors. Degradation analysis and modeling of aluminum electrolytic capacitor and powder iron inductor
- Is Part Of:
- Microelectronics and reliability. Volume 55:Issue 9/10(2015)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 55:Issue 9/10(2015)
- Issue Display:
- Volume 55, Issue 9/10 (2015)
- Year:
- 2015
- Volume:
- 55
- Issue:
- 9/10
- Issue Sort Value:
- 2015-0055-NaN-0000
- Page Start:
- 2061
- Page End:
- 2066
- Publication Date:
- 2015-08
- Subjects:
- Counterfeit detection -- Electromagnetic emission -- Integrated circuit
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2015.06.058 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 9153.xml