Cite
MLA Citation
N. Wrachien et al.. “Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics.” Microelectronics and reliability, vol. 55, no. 9, 2015, pp. 1790–1794. http://access.bl.uk/ark:/81055/vdc_100051343903.0x000060