Cite
HARVARD Citation
Wrachien, N. et al. (2015). Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectronics and reliability. 55 (9), pp. 1790-1794. [Online].
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Wrachien, N. et al. (2015). Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectronics and reliability. 55 (9), pp. 1790-1794. [Online].