Cite
MLA Citation
Evangelia-Nefeli Athanasopoulou et al.. “Bimodal atomic force microscopy for the characterization of thiolated self-assembled monolayers.” Nanoscale, vol. 10, no. 48, 2018, pp. 23027–23036. http://access.bl.uk/ark:/81055/vdc_100075227408.0x000029