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HARVARD Citation
Athanasopoulou, E. et al. (2018). Bimodal atomic force microscopy for the characterization of thiolated self-assembled monolayers. Nanoscale. 10 (48), pp. 23027-23036. [Online].
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Athanasopoulou, E. et al. (2018). Bimodal atomic force microscopy for the characterization of thiolated self-assembled monolayers. Nanoscale. 10 (48), pp. 23027-23036. [Online].