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APA Citation
Wielgoszewski, G., Pałetko, P., Tomaszewski, D., Zaborowski, M., Jóźwiak, G., Kopiec, D., Gotszalk, T., & Grabiec, P. (n.d.). carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy. Micron, 79, 93–100. http://access.bl.uk/ark:/81055/vdc_100042112060.0x000013