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APA Citation
Huang, Q., Yang, J., Huang, W., Liu, Y., Hu, H., Giunta, G., & Belouettar, S. (2017). a new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates. Composite structures, 160, 613–624. http://access.bl.uk/ark:/81055/vdc_100040772344.0x00004b